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- 01GMVB42YZ7M41FSKMW0A8VYYD classification C3.
- 01GMVB42YZ7M41FSKMW0A8VYYD date "2022".
- 01GMVB42YZ7M41FSKMW0A8VYYD language "eng".
- 01GMVB42YZ7M41FSKMW0A8VYYD type conference.
- 01GMVB42YZ7M41FSKMW0A8VYYD hasPart 01GMX60QGTNKBT0MEZ5DQV3EB9.pdf.
- 01GMVB42YZ7M41FSKMW0A8VYYD subject "Technology and Engineering".
- 01GMVB42YZ7M41FSKMW0A8VYYD doi "10.5281/zenodo.7405881".
- 01GMVB42YZ7M41FSKMW0A8VYYD presentedAt urn:uuid:a251b5dd-841f-4777-87cb-8362cae68ee5.
- 01GMVB42YZ7M41FSKMW0A8VYYD abstract "For every project or application, it is important to select a material that exhibits the desired mechanical properties. To be able to do so, the performance of multiple materials needs to be determined via mechanical testing. Here, we present the ability to combine mechanical tests with microstructural observations, which gives new insight into the microscale deformation and fracture mechanisms present in materials. Thanks to Scanning Electron Microscopy (SEM) during testing, we are able to perform in-situ visualization of the microstructure of the material and how it responds to mechanical loads. SEM offers a high resolution, a wide range of magnification, and a higher field of depth than traditional optical microscopic techniques. With these new insights, materials can be tuned more efficiently towards their specific applications.".
- 01GMVB42YZ7M41FSKMW0A8VYYD author 11F04C9E-F0EE-11E1-A9DE-61C894A0A6B4.
- 01GMVB42YZ7M41FSKMW0A8VYYD author F4C9EBE8-F0ED-11E1-A9DE-61C894A0A6B4.
- 01GMVB42YZ7M41FSKMW0A8VYYD author F574E142-F0ED-11E1-A9DE-61C894A0A6B4.
- 01GMVB42YZ7M41FSKMW0A8VYYD author FDFB120E-FFAC-11E2-99A4-C36710BDE39D.
- 01GMVB42YZ7M41FSKMW0A8VYYD dateCreated "2022-12-21T21:58:36Z".
- 01GMVB42YZ7M41FSKMW0A8VYYD dateModified "2024-10-29T16:04:41Z".
- 01GMVB42YZ7M41FSKMW0A8VYYD name "Observing deformation mechanisms at microscale".
- 01GMVB42YZ7M41FSKMW0A8VYYD pagination urn:uuid:45ef8e50-233a-439b-9146-d890b7378e4a.
- 01GMVB42YZ7M41FSKMW0A8VYYD sameAs LU-01GMVB42YZ7M41FSKMW0A8VYYD.
- 01GMVB42YZ7M41FSKMW0A8VYYD sourceOrganization urn:uuid:0c445980-c507-4f16-9667-a96acab6af2e.
- 01GMVB42YZ7M41FSKMW0A8VYYD type C3.