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- Reliability_(semiconductor) abstract "Reliability of semiconductor devices can be summarized as follows: Semiconductor devices are very sensitive to impurities and particles. Therefore, to manufacture these devices it is necessary to manage many processes while accurately controlling the level of impurities and particles. The finished product quality depends upon the many layered relationship of each interacting substance in the semiconductor, including metallization, chip material (list of semiconductor materials) and package. The problems of micro-processes, and thin films and must be fully understood as they apply to metallization and wire bonding. It is also necessary to analyze surface phenomena from the aspect of thin films. Due to the rapid advances in technology, many new devices are developed using new materials and processes, and design calendar time is limited due to non-recurring engineering constraints, plus time to market concerns. Consequently, it is not possible to base new designs on the reliability of existing devices. To achieve economy of scale, semiconductor products are manufactured in high volume. Furthermore, repair of finished semiconductor products is impractical. Therefore, incorporation of reliability at the design stage and reduction of variation in the production stage have become essential. Reliability of semiconductor devices may depend on assembly, use, and environmental conditions. Stress factors affecting device reliability include gas, dust, contamination, voltage, current density, temperature, humidity, mechanical stress, vibration, shock, radiation, pressure, and intensity of magnetic and electrical fields.Design factors affecting semiconductor reliability include: voltage derating, power derating, current derating, metastability, logic timing margins (logic simulation), timing analysis, temperature derating, and process control.".
- Reliability_(semiconductor) wikiPageExternalLink rej27l0001_reliabilityhb.pdf.
- Reliability_(semiconductor) wikiPageExternalLink 4.PDF.
- Reliability_(semiconductor) wikiPageExternalLink rs&h.htm.
- Reliability_(semiconductor) wikiPageExternalLink www.eurelnet.org.
- Reliability_(semiconductor) wikiPageID "20575536".
- Reliability_(semiconductor) wikiPageRevisionID "590915049".
- Reliability_(semiconductor) hasPhotoCollection Reliability_(semiconductor).
- Reliability_(semiconductor) subject Category:Electronic_design.
- Reliability_(semiconductor) subject Category:Packaging.
- Reliability_(semiconductor) subject Category:Semiconductor_device_fabrication.
- Reliability_(semiconductor) subject Category:Semiconductors.
- Reliability_(semiconductor) type Abstraction100002137.
- Reliability_(semiconductor) type Conductor114821043.
- Reliability_(semiconductor) type Material114580897.
- Reliability_(semiconductor) type Matter100020827.
- Reliability_(semiconductor) type Part113809207.
- Reliability_(semiconductor) type PhysicalEntity100001930.
- Reliability_(semiconductor) type Relation100031921.
- Reliability_(semiconductor) type Semiconductor114821248.
- Reliability_(semiconductor) type Semiconductors.
- Reliability_(semiconductor) type Substance100019613.
- Reliability_(semiconductor) comment "Reliability of semiconductor devices can be summarized as follows: Semiconductor devices are very sensitive to impurities and particles. Therefore, to manufacture these devices it is necessary to manage many processes while accurately controlling the level of impurities and particles. The finished product quality depends upon the many layered relationship of each interacting substance in the semiconductor, including metallization, chip material (list of semiconductor materials) and package.".
- Reliability_(semiconductor) label "Reliability (semiconductor)".
- Reliability_(semiconductor) label "半导体器件可靠性".
- Reliability_(semiconductor) sameAs m.051xsx7.
- Reliability_(semiconductor) sameAs Q7310987.
- Reliability_(semiconductor) sameAs Q7310987.
- Reliability_(semiconductor) sameAs Reliability_(semiconductor).
- Reliability_(semiconductor) wasDerivedFrom Reliability_(semiconductor)?oldid=590915049.
- Reliability_(semiconductor) isPrimaryTopicOf Reliability_(semiconductor).