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- 00048787 contributor B41972.
- 00048787 contributor B41973.
- 00048787 created "c2000.".
- 00048787 date "2000".
- 00048787 date "c2000.".
- 00048787 dateCopyrighted "c2000.".
- 00048787 description "Includes bibliographical references and index.".
- 00048787 extent "viii, 624 p. :".
- 00048787 identifier "0792366859 (acid-free paper)".
- 00048787 identifier 00048787-d.html.
- 00048787 identifier 00048787-t.html.
- 00048787 isPartOf "NATO science series. Series II, Mathematics, physics, and chemistry ; v. 2".
- 00048787 issued "2000".
- 00048787 issued "c2000.".
- 00048787 language "eng".
- 00048787 publisher "Dordrecht, Netherlands, Boston, MA : Kluwer Academic Publishers,".
- 00048787 subject "548/.85 21".
- 00048787 subject "Crystals Defects Congresses.".
- 00048787 subject "QD181.S6 D43 2000".
- 00048787 subject "Silica Electric properties Congresses.".
- 00048787 title "Defects in SiO₂ and related dielectrics : science and technology / edited by G. Pacchioni, L. Skuja, D.L. Griscom.".
- 00048787 type "text".