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- 93000734 contributor B6890437.
- 93000734 created "c1993.".
- 93000734 date "1993".
- 93000734 date "c1993.".
- 93000734 dateCopyrighted "c1993.".
- 93000734 description "Includes bibliographical references and index.".
- 93000734 extent "xiii, 551 p. :".
- 93000734 identifier "0824789326 (acid-free paper)".
- 93000734 identifier 93000734-d.html.
- 93000734 isPartOf "Optical engineering (Marcel Dekker, Inc.) ; v. 38.".
- 93000734 isPartOf "Optical engineering ; 38".
- 93000734 issued "1993".
- 93000734 issued "c1993.".
- 93000734 language "eng".
- 93000734 publisher "New York : Marcel Dekker,".
- 93000734 subject "620.1/127 20".
- 93000734 subject "Nondestructive testing.".
- 93000734 subject "Speckle metrology.".
- 93000734 subject "TA417.2 .S66 1993".
- 93000734 title "Speckle metrology / edited by Rajpal S. Sirohi.".
- 93000734 type "text".