Matches in LOV for { ?s ?p ?o. }
- sampling hasPart sampledFeature.
- sampling hasPart samplingFeatureComplex.
- sampling hasPart samplingLocation.
- sampling hasPart samplingMethod.
- sampling hasPart samplingTime.
- sampling hasPart shape.
- sampling hasPart size.
- sampling hasPart specimenType.
- sampling hasPart time.
- sampling issued "2012-01-19".
- sampling language eng.
- sampling license 3.0.
- sampling modified "2013-11-14T00:00:00".
- sampling modified "2014-08-28".
- sampling title "The Sampling Features Schema Vocabulary".
- sampling hasReview BX2D63e01bc9X3A149d30d2615X3AX2D7f1e.
- sampling hasReview BX2D63e01bc9X3A149d30d2615X3AX2D7f1f.
- sampling hasReview BX2D63e01bc9X3A149d30d2615X3AX2D7f20.
- sampling preferredNamespacePrefix "sam".
- sampling preferredNamespacePrefix "sam".
- sampling preferredNamespaceUri "http://def.seegrid.csiro.au/isotc211/iso19156/2011/sampling#".
- sampling preferredNamespaceUri sampling.
- sampling type Vocabulary.
- sampling type Ontology.
- sampling comment "An OWL representation of the Sampling Features Schema described in clauses 8-10 of ISO 19156:2011 Geographic Information - Observations and Measurements. \n\nThis vocabulary is provisional, pending finalization of ISO 19150-2.\n\nNOTE: The URI stem http://def.seegrid.csiro.au/isotc211/ is temporary. The vocabulary is expected to be ultimately published in the domain http://def.isotc211.org/".
- sampling imports basic.
- sampling imports geometry.
- sampling imports temporal.
- sampling imports dataquality.
- sampling imports basic.
- sampling imports observation.
- sampling priorVersion sampling.rdf.
- sampling versionIRI sampling.rdf.
- sampling distribution file_sam_2012-07-24.n3.
- sampling distribution file_sam_2013-11-14.n3.
- sampling distribution file_sam_2014-08-28.n3.
- sampling keyword "Methods".
- sampling homepage "http://www.essepuntato.it/lode/owlapi/http://def.seegrid.csiro.au/isotc211/iso19156/2011/sampling".
- Location type Class.
- Location comment "Location, expressed as either a spatial object or geographic identifier".
- Location isDefinedBy sampling.
- Location label "Location".
- Location unionOf B6ab01637b8a62c462990472aa397be55.
- Location notation "Location".
- NotSamplingFeature type Class.
- NotSamplingFeature comment "Complement of SamplingFeature".
- NotSamplingFeature isDefinedBy sampling.
- NotSamplingFeature label "Not a sampling feature".
- NotSamplingFeature subClassOf AnyFeature.
- NotSamplingFeature disjointWith SamplingFeature.
- PreparationStep type Class.
- PreparationStep comment "Discrete stage in specimen-preparation process".
- PreparationStep comment "In many applications, specimen preparation procedures are applied to the material prior to its use in an observation. The class PreparationStep (Figure 13) shall link an SF_Specimen to an SF_Process that describes a phase of the specimen preparation.".
- PreparationStep isDefinedBy sampling.
- PreparationStep label "Preparation step".
- PreparationStep subClassOf B3a76d448b0ab963ab77b73d31bfa3848.
- PreparationStep subClassOf B9adfe4d00d9da9e019e0b70844c1fa30.
- PreparationStep subClassOf Bed40dbbe5b4da1c83f308cd997685dbb.
- PreparationStep subClassOf Thing.
- PreparationStep notation "PreparationStep".
- Process type Class.
- Process comment "In many applications, specimen preparation procedures are applied to the material prior to its use in an observation. The class PreparationStep (Figure 13) shall link an SF_Specimen to an SF_Process that describes a phase of the specimen preparation.".
- Process comment "Process involved in sampling. This may include specimen retrieval or processing, surveying a spatial sampling feature, excavation to provide access to a sampling feature, or any other process whose outcome is a new sampling feature.".
- Process isDefinedBy sampling.
- Process label "Sampling process".
- Process subClassOf AnyFeature.
- Process subClassOf NotSamplingFeature.
- Process disjointWith Process.
- Process notation "SF_Process".
- SamplingCurve type Class.
- SamplingCurve comment "Spatial sampling feature whose shape is a 1-D manifold (Curve)".
- SamplingCurve isDefinedBy sampling.
- SamplingCurve label "Sampling curve".
- SamplingCurve subClassOf B02fde847e6a7a4bbfe25951ebeee7696.
- SamplingCurve subClassOf SpatialSamplingFeature.
- SamplingCurve notation "SF_SamplingCurve".
- SamplingFeature type Class.
- SamplingFeature comment "Feature on which observations may be made, that is intended to be representative of a different (usually larger) feature that is not fully accessible for some reason. ".
- SamplingFeature comment "Sampling features are artefacts of an observational strategy, and have no significant function outside of their role in the observation process. The physical characteristics of the features themselves are of little interest, except perhaps to the manager of a sampling campaign.\n\nEXAMPLE A “station” is essentially an identifiable locality where a sensor system or procedure may be deployed and an observation made. In the context of the observation model, it connotes the “world in the vicinity of the station”, so the observed properties relate to the physical medium at the station, and not to any physical artefact such as a mooring, buoy, benchmark, monument, well, etc.\n\nNOTE A transient sampling feature, such as a ships-track or flight-line, might be identified and described, but is unlikely to be revisited exactly.\n\nA sampling feature is intended to sample some feature-of-interest in an application domain. However, in some cases the identity, and even the exact type, of the sampled feature may not be known when observations are made using the sampling features.".
- SamplingFeature isDefinedBy sampling.
- SamplingFeature label "Sampling Feature".
- SamplingFeature subClassOf B20e6266836358e4fbbb2a270ac0b2575.
- SamplingFeature subClassOf B5aecb366b26caf833793dfc1ef313753.
- SamplingFeature subClassOf Bb279de164595a5b0887598c0f13e2b75.
- SamplingFeature subClassOf Bc3e7fc1e597163faf944868c2949bc0e.
- SamplingFeature subClassOf AnyFeature.
- SamplingFeature disjointWith NotSamplingFeature.
- SamplingFeature notation "SF_SamplingFeature".
- SamplingFeatureCollection type Class.
- SamplingFeatureCollection comment "Collection of sampling features".
- SamplingFeatureCollection comment "The class SF_SamplingFeatureCollection (Figure 9) is an instance of the «metaclass» GF_FeatureType (ISO 19109), which therefore represents a feature type. SF_SamplingFeatureCollection shall support one association.".
- SamplingFeatureCollection isDefinedBy sampling.
- SamplingFeatureCollection label "Sampling feature collection".
- SamplingFeatureCollection subClassOf Bce473a4f1e7a5c8a4bcf07af970761a5.
- SamplingFeatureCollection subClassOf AnyFeature.
- SamplingFeatureCollection notation "SF_SamplingFeatureCollection".
- SamplingFeatureComplex type Class.
- SamplingFeatureComplex comment "Sampling features are frequently related to each other, as parts of complexes, through sub-sampling, and in other ways. If present, the association class SamplingFeatureComplex (Figure 9) shall link an SF_SamplingFeature to another SF_SamplingFeature.".
- SamplingFeatureComplex comment "Set of sampling features related to each other in a specific and deliberate way.".
- SamplingFeatureComplex isDefinedBy sampling.