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- Atomic_force_microscopy abstract "Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope (also abbreviated as AFM) in 1986. The first commercially available atomic force microscope was introduced in 1989. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale.The information is gathered by "feeling" the surface with a mechanical probe.Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable the very precise scanning. In some variations, electric potentials can also be scanned using conducting cantilevers. In more advanced versions, currents can be passed through the tip to probe the electrical conductivity or transport of the underlying surface, but this is much more challenging with few research groups reporting consistent data (as of 2004).".
- Atomic_force_microscopy thumbnail Atomic_force_microscope_by_Zureks.jpg?width=300.
- Atomic_force_microscopy wikiPageExternalLink cr960068q.
- Atomic_force_microscopy wikiPageExternalLink RevModPhys.75.949.
- Atomic_force_microscopy wikiPageExternalLink www.afmuniversity.org.
- Atomic_force_microscopy wikiPageExternalLink index.php.
- Atomic_force_microscopy wikiPageExternalLink gallery.htm.
- Atomic_force_microscopy wikiPageExternalLink spm.
- Atomic_force_microscopy wikiPageExternalLink ?content=05.
- Atomic_force_microscopy wikiPageID "227982".
- Atomic_force_microscopy wikiPageRevisionID "605726018".
- Atomic_force_microscopy align "right".
- Atomic_force_microscopy caption "Electron micrograph of a used AFM cantilever image width ~100 micrometers...".
- Atomic_force_microscopy caption "and ~30 micrometers".
- Atomic_force_microscopy direction "vertical".
- Atomic_force_microscopy hasPhotoCollection Atomic_force_microscopy.
- Atomic_force_microscopy image "AFM cantilever in Scanning Electron Microscope, magnification 1000x.JPG".
- Atomic_force_microscopy image "AFM cantilever in Scanning Electron Microscope, magnification 3000x.JPG".
- Atomic_force_microscopy width "190".
- Atomic_force_microscopy subject Category:Intermolecular_forces.
- Atomic_force_microscopy subject Category:Scanning_probe_microscopy.
- Atomic_force_microscopy subject Category:Scientific_techniques.
- Atomic_force_microscopy subject Category:Semiconductor_analysis.
- Atomic_force_microscopy type Ability105616246.
- Atomic_force_microscopy type Abstraction100002137.
- Atomic_force_microscopy type Attribute100024264.
- Atomic_force_microscopy type Cognition100023271.
- Atomic_force_microscopy type Force105194578.
- Atomic_force_microscopy type Influence105194151.
- Atomic_force_microscopy type IntermolecularForces.
- Atomic_force_microscopy type Know-how105616786.
- Atomic_force_microscopy type Method105660268.
- Atomic_force_microscopy type Power105190804.
- Atomic_force_microscopy type PsychologicalFeature100023100.
- Atomic_force_microscopy type Quality104723816.
- Atomic_force_microscopy type ScientificTechniques.
- Atomic_force_microscopy type Technique105665146.
- Atomic_force_microscopy comment "Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986.".
- Atomic_force_microscopy label "Atomic force microscopy".
- Atomic_force_microscopy label "Atoomkrachtmicroscoop".
- Atomic_force_microscopy label "Microscope à force atomique".
- Atomic_force_microscopy label "Microscopio a forza atomica".
- Atomic_force_microscopy label "Microscopio de fuerza atómica".
- Atomic_force_microscopy label "Microscópio de força atômica".
- Atomic_force_microscopy label "Mikroskop sił atomowych".
- Atomic_force_microscopy label "Rasterkraftmikroskop".
- Atomic_force_microscopy label "Сканирующий атомно-силовой микроскоп".
- Atomic_force_microscopy label "مجهر القوة الذرية".
- Atomic_force_microscopy label "原子力显微镜".
- Atomic_force_microscopy label "原子間力顕微鏡".
- Atomic_force_microscopy sameAs Mikroskopie_atomárních_sil.
- Atomic_force_microscopy sameAs Rasterkraftmikroskop.
- Atomic_force_microscopy sameAs Microscopio_de_fuerza_atómica.
- Atomic_force_microscopy sameAs Microscope_à_force_atomique.
- Atomic_force_microscopy sameAs Mikroskop_gaya_atom.
- Atomic_force_microscopy sameAs Microscopio_a_forza_atomica.
- Atomic_force_microscopy sameAs 原子間力顕微鏡.
- Atomic_force_microscopy sameAs 원자간력_현미경.
- Atomic_force_microscopy sameAs Atoomkrachtmicroscoop.
- Atomic_force_microscopy sameAs Mikroskop_sił_atomowych.
- Atomic_force_microscopy sameAs Microscópio_de_força_atômica.
- Atomic_force_microscopy sameAs m.01h663.
- Atomic_force_microscopy sameAs Q49295.
- Atomic_force_microscopy sameAs Q49295.
- Atomic_force_microscopy sameAs Atomic_force_microscopy.
- Atomic_force_microscopy wasDerivedFrom Atomic_force_microscopy?oldid=605726018.
- Atomic_force_microscopy depiction Atomic_force_microscope_by_Zureks.jpg.
- Atomic_force_microscopy isPrimaryTopicOf Atomic_force_microscopy.