Matches in DBpedia 2014 for { <http://dbpedia.org/resource/Built-in_self-test> ?p ?o. }
Showing items 1 to 33 of
33
with 100 items per page.
- Built-in_self-test abstract "A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as:high reliabilitylower repair cycle timesor constraints such as:limited technician accessibilitycost of testing during manufactureThe main purpose[citation needed] of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment. BIST reduces cost in two ways: reduces test-cycle duration reduces the complexity of the test/probe setup, by reducing the number of I/O signals that must be driven/examined under tester control.Both lead to a reduction in hourly charges for automated test equipment (ATE) service.".
- Built-in_self-test wikiPageExternalLink bist.html.
- Built-in_self-test wikiPageExternalLink hardware_diagnostics.htm.
- Built-in_self-test wikiPageID "1430422".
- Built-in_self-test wikiPageRevisionID "601631806".
- Built-in_self-test hasPhotoCollection Built-in_self-test.
- Built-in_self-test subject Category:Integrated_circuits.
- Built-in_self-test subject Category:Test_equipment.
- Built-in_self-test type Artifact100021939.
- Built-in_self-test type Circuit103033362.
- Built-in_self-test type ComputerCircuit103084420.
- Built-in_self-test type Device103183080.
- Built-in_self-test type ElectricalDevice103269401.
- Built-in_self-test type Instrumentality103575240.
- Built-in_self-test type IntegratedCircuit103577090.
- Built-in_self-test type IntegratedCircuits.
- Built-in_self-test type Object100002684.
- Built-in_self-test type PhysicalEntity100001930.
- Built-in_self-test type Whole100003553.
- Built-in_self-test comment "A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as:high reliabilitylower repair cycle timesor constraints such as:limited technician accessibilitycost of testing during manufactureThe main purpose[citation needed] of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment.".
- Built-in_self-test label "Built-in self-test".
- Built-in_self-test label "Built-in self-test".
- Built-in_self-test label "Built-in-self-test".
- Built-in_self-test label "内建自测试".
- Built-in_self-test sameAs Built-in-self-test.
- Built-in_self-test sameAs Built-in_self-test.
- Built-in_self-test sameAs 내장_자체시험.
- Built-in_self-test sameAs m.050y19.
- Built-in_self-test sameAs Q181142.
- Built-in_self-test sameAs Q181142.
- Built-in_self-test sameAs Built-in_self-test.
- Built-in_self-test wasDerivedFrom Built-in_self-test?oldid=601631806.
- Built-in_self-test isPrimaryTopicOf Built-in_self-test.