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- Electron_beam-induced_current abstract "Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties. EBIC is similar to cathodoluminescence in that it depends on the creation of electron–hole pairs in the semiconductor sample by the microscope's electron beam. This technique is used in semiconductor failure analysis and solid-state physics.".
- Electron_beam-induced_current thumbnail Ebic_figure.jpg?width=300.
- Electron_beam-induced_current wikiPageExternalLink ebic-amplifier.
- Electron_beam-induced_current wikiPageExternalLink ?page_id=11.
- Electron_beam-induced_current wikiPageExternalLink SmartEBIC.php.
- Electron_beam-induced_current wikiPageExternalLink ISM6A.html.
- Electron_beam-induced_current wikiPageExternalLink electron-beam-induced-current-scanning-electron-microscope.
- Electron_beam-induced_current wikiPageExternalLink diss5-ebic.html.
- Electron_beam-induced_current wikiPageID "6905518".
- Electron_beam-induced_current wikiPageRevisionID "577773024".
- Electron_beam-induced_current hasPhotoCollection Electron_beam-induced_current.
- Electron_beam-induced_current subject Category:Electron_beam.
- Electron_beam-induced_current subject Category:Scientific_techniques.
- Electron_beam-induced_current subject Category:Semiconductor_analysis.
- Electron_beam-induced_current subject Category:Semiconductor_device_fabrication.
- Electron_beam-induced_current comment "Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties. EBIC is similar to cathodoluminescence in that it depends on the creation of electron–hole pairs in the semiconductor sample by the microscope's electron beam.".
- Electron_beam-induced_current label "EBIC".
- Electron_beam-induced_current label "Electron beam-induced current".
- Electron_beam-induced_current sameAs EBIC.
- Electron_beam-induced_current sameAs m.0gwfv8.
- Electron_beam-induced_current sameAs Q3717138.
- Electron_beam-induced_current sameAs Q3717138.
- Electron_beam-induced_current wasDerivedFrom Electron_beam-induced_current?oldid=577773024.
- Electron_beam-induced_current depiction Ebic_figure.jpg.
- Electron_beam-induced_current isPrimaryTopicOf Electron_beam-induced_current.