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- Joint_Test_Action_Group abstract "Joint Test Action Group (JTAG) is the common name for the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised by electronic engineers for testing printed circuit boards using boundary scan and is still widely used for this application.Today, JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors implement JTAG when they have enough pins. Embedded systems development relies on debuggers communicating with chips with JTAG to perform operations like single stepping and breakpointing.".
- Joint_Test_Action_Group wikiPageExternalLink abs_all.jsp?arnumber=5412866.
- Joint_Test_Action_Group wikiPageExternalLink JTAG_Tutorial.htm.
- Joint_Test_Action_Group wikiPageExternalLink jtag-101-ieee-1149x-paper.pdf.
- Joint_Test_Action_Group wikiPageExternalLink jtag-ieee-1149-basics-tutorial.php.
- Joint_Test_Action_Group wikiPageExternalLink ssya002c.pdf.
- Joint_Test_Action_Group wikiPageID "638112".
- Joint_Test_Action_Group wikiPageRevisionID "601851421".
- Joint_Test_Action_Group hasPhotoCollection Joint_Test_Action_Group.
- Joint_Test_Action_Group subject Category:Electronics_manufacturing.
- Joint_Test_Action_Group subject Category:Embedded_systems.
- Joint_Test_Action_Group subject Category:Hardware_testing.
- Joint_Test_Action_Group subject Category:IEEE_standards.
- Joint_Test_Action_Group type Artifact100021939.
- Joint_Test_Action_Group type EmbeddedSystems.
- Joint_Test_Action_Group type Instrumentality103575240.
- Joint_Test_Action_Group type Object100002684.
- Joint_Test_Action_Group type PhysicalEntity100001930.
- Joint_Test_Action_Group type System104377057.
- Joint_Test_Action_Group type Whole100003553.
- Joint_Test_Action_Group comment "Joint Test Action Group (JTAG) is the common name for the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised by electronic engineers for testing printed circuit boards using boundary scan and is still widely used for this application.Today, JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors implement JTAG when they have enough pins.".
- Joint_Test_Action_Group label "JTAG".
- Joint_Test_Action_Group label "JTAG".
- Joint_Test_Action_Group label "JTAG".
- Joint_Test_Action_Group label "JTAG".
- Joint_Test_Action_Group label "JTAG".
- Joint_Test_Action_Group label "JTAG".
- Joint_Test_Action_Group label "JTAG".
- Joint_Test_Action_Group label "Joint Test Action Group".
- Joint_Test_Action_Group label "Joint Test Action Group".
- Joint_Test_Action_Group label "Joint Test Action Group".
- Joint_Test_Action_Group sameAs Joint_Test_Action_Group.
- Joint_Test_Action_Group sameAs Joint_Test_Action_Group.
- Joint_Test_Action_Group sameAs JTAG.
- Joint_Test_Action_Group sameAs Joint_Test_Action_Group.
- Joint_Test_Action_Group sameAs JTAG.
- Joint_Test_Action_Group sameAs JTAG.
- Joint_Test_Action_Group sameAs JTAG.
- Joint_Test_Action_Group sameAs JTAG.
- Joint_Test_Action_Group sameAs JTAG.
- Joint_Test_Action_Group sameAs m.02zdjl.
- Joint_Test_Action_Group sameAs Q545306.
- Joint_Test_Action_Group sameAs Q545306.
- Joint_Test_Action_Group sameAs Joint_Test_Action_Group.
- Joint_Test_Action_Group wasDerivedFrom Joint_Test_Action_Group?oldid=601851421.
- Joint_Test_Action_Group homepage abs_all.jsp?arnumber=5412866.
- Joint_Test_Action_Group isPrimaryTopicOf Joint_Test_Action_Group.