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- Scanning_Helium_Ion_Microscope abstract "A Scanning Helium Ion Microscope (SHIM, HeIM or HIM) is a new imaging technology based on a scanning helium ion beam. This technology has several advantages over the traditional scanning electron microscope (SEM). Due to the very high source brightness, and the short De Broglie wavelength of the helium ions, which is inversely proportional to their momentum, it is possible to obtain qualitative data not achievable with conventional microscopes which use photons or electrons as the emitting source. As the helium ion beam interacts with the sample, it does not suffer from a large excitation volume, and hence provides sharp images on a wide range of materials. Compared to a SEM, the secondary electron yield is quite high, allowing for imaging with currents as low as 1 femtoamp. The detectors provide information-rich images which offer topographic, material, crystallographic, and electrical properties of the sample. In contrast to other ion beams, there is no discernible sample damage due to relatively light mass of the helium ion. The drawback is the cost.Since 2007 this technology is commercialized and instruments have been shipped to customers. A surface resolution of 0.24 nanometers has been demonstrated.".
- Scanning_Helium_Ion_Microscope wikiPageExternalLink 080904115132.htm.
- Scanning_Helium_Ion_Microscope wikiPageExternalLink 2006_microscopytoday.pdf.
- Scanning_Helium_Ion_Microscope wikiPageExternalLink orion.
- Scanning_Helium_Ion_Microscope wikiPageID "4756896".
- Scanning_Helium_Ion_Microscope wikiPageRevisionID "577830451".
- Scanning_Helium_Ion_Microscope hasPhotoCollection Scanning_Helium_Ion_Microscope.
- Scanning_Helium_Ion_Microscope subject Category:Microscopes.
- Scanning_Helium_Ion_Microscope type Artifact100021939.
- Scanning_Helium_Ion_Microscope type Device103183080.
- Scanning_Helium_Ion_Microscope type Instrument103574816.
- Scanning_Helium_Ion_Microscope type Instrumentality103575240.
- Scanning_Helium_Ion_Microscope type Magnifier103709206.
- Scanning_Helium_Ion_Microscope type Microscope103760671.
- Scanning_Helium_Ion_Microscope type Microscopes.
- Scanning_Helium_Ion_Microscope type Object100002684.
- Scanning_Helium_Ion_Microscope type PhysicalEntity100001930.
- Scanning_Helium_Ion_Microscope type ScientificInstrument104147495.
- Scanning_Helium_Ion_Microscope type Whole100003553.
- Scanning_Helium_Ion_Microscope comment "A Scanning Helium Ion Microscope (SHIM, HeIM or HIM) is a new imaging technology based on a scanning helium ion beam. This technology has several advantages over the traditional scanning electron microscope (SEM).".
- Scanning_Helium_Ion_Microscope label "Helium-Ionen-Mikroskop".
- Scanning_Helium_Ion_Microscope label "Scanning Helium Ion Microscope".
- Scanning_Helium_Ion_Microscope label "Сканирующий гелиевый ионный микроскоп".
- Scanning_Helium_Ion_Microscope sameAs Helium-Ionen-Mikroskop.
- Scanning_Helium_Ion_Microscope sameAs m.0clpl5.
- Scanning_Helium_Ion_Microscope sameAs Q55236.
- Scanning_Helium_Ion_Microscope sameAs Q55236.
- Scanning_Helium_Ion_Microscope sameAs Scanning_Helium_Ion_Microscope.
- Scanning_Helium_Ion_Microscope wasDerivedFrom Scanning_Helium_Ion_Microscope?oldid=577830451.
- Scanning_Helium_Ion_Microscope isPrimaryTopicOf Scanning_Helium_Ion_Microscope.