Matches in DBpedia 2014 for { <http://dbpedia.org/resource/Surface_analysis_tools> ?p ?o. }
Showing items 1 to 28 of
28
with 100 items per page.
- Surface_analysis_tools abstract "Surface analysis tools are instruments and spectrometers that use surface analysis techniques such as AES (Auger Electron Spectroscopy) sometimes called Scanning Auger Microscopy (SAM); XPS (X-ray photoelectron spectroscopy) also known as ESCA (Electron Spectroscopy for Chemical Analysis); and SIMS (Secondary ion mass spectrometry) to characterize the composition and structure of the top few layers of atoms in a surface. Note that there are numerous related techniques which may also qualify as "surface analysis".Surface analysis most often uses electron, x-ray, or ion probes to remove electrons or ions from the material so as to characterize the elemental composition, chemistry and elemental distribution in a region that is, roughly, (1 to 10 nm) thick. If information is desired from a thicker region of the specimen, depth profiling techniques are often used where a high energy ion (generally between 500 and 5,000 eV) is employed to strip material off the surface and the resultant freshly exposed surface is then analyzed.".
- Surface_analysis_tools wikiPageID "10838269".
- Surface_analysis_tools wikiPageRevisionID "534812258".
- Surface_analysis_tools date "March 2009".
- Surface_analysis_tools expert "spectroscopy".
- Surface_analysis_tools hasPhotoCollection Surface_analysis_tools.
- Surface_analysis_tools incomplete "July 2008".
- Surface_analysis_tools unreferenced "July 2007".
- Surface_analysis_tools subject Category:Spectrometers.
- Surface_analysis_tools type Artifact100021939.
- Surface_analysis_tools type Device103183080.
- Surface_analysis_tools type Instrument103574816.
- Surface_analysis_tools type Instrumentality103575240.
- Surface_analysis_tools type MassSpectrometer103726516.
- Surface_analysis_tools type Object100002684.
- Surface_analysis_tools type OpticalInstrument103852280.
- Surface_analysis_tools type PhysicalEntity100001930.
- Surface_analysis_tools type Spectrometers.
- Surface_analysis_tools type Spectroscope104273064.
- Surface_analysis_tools type Whole100003553.
- Surface_analysis_tools comment "Surface analysis tools are instruments and spectrometers that use surface analysis techniques such as AES (Auger Electron Spectroscopy) sometimes called Scanning Auger Microscopy (SAM); XPS (X-ray photoelectron spectroscopy) also known as ESCA (Electron Spectroscopy for Chemical Analysis); and SIMS (Secondary ion mass spectrometry) to characterize the composition and structure of the top few layers of atoms in a surface.".
- Surface_analysis_tools label "Surface analysis tools".
- Surface_analysis_tools sameAs m.02qrlnq.
- Surface_analysis_tools sameAs Q16977756.
- Surface_analysis_tools sameAs Q16977756.
- Surface_analysis_tools sameAs Surface_analysis_tools.
- Surface_analysis_tools wasDerivedFrom Surface_analysis_tools?oldid=534812258.
- Surface_analysis_tools isPrimaryTopicOf Surface_analysis_tools.