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- catalog contributor b673876.
- catalog contributor b673877.
- catalog contributor b673878.
- catalog created "c1986.".
- catalog date "1986".
- catalog date "c1986.".
- catalog dateCopyrighted "c1986.".
- catalog description "Bibliography: p. 284-313.".
- catalog description "Robustness of Some Classical Tests -- Student's t test -- Asymptotic robustness of the t test -- Variance-ratio test for comparing several means -- Asymptotic robustness of the variance-ratio test -- Small-sample distributions of t and F under nonnormal distributions and robustness -- Small-sample null distribution of F and type I robustness -- Small-sample power of the t test and the F test -- Testing equality of two variances -- Laguerre polynomial expansion of nonnegative random variables -- Estimation Procedures for Censored Samples -- Type II censoring -- Truncated distributions and their cumulants -- Estimation of parameters from type II censored samples -- Least-squares estimators (BLUEs) -- Maximum likelihood estimators (MLEs) -- MMLEs for the normal -- Robust estimators and comparisons with the MMLEs -- Random choice of the proportion of censoring -- Adaptive estimators of location -- Order statistics -- MMLEs for Other Distributions -- MMLE for log-normal distribution -- MMLE for the logistic distribution -- Estimation of parameters of exponential distribution -- MML estimation of parameters for Rayleigh distribution -- MML estimation in progressively censored samples -- MML estimation for truncated distributions -- Robust Tests -- Robust Studentized one-sample tests -- Testing equality of two location parameters when scale parameters are equal -- Testing equality of location parameters of extreme skew distributions -- Comparison of two location parameters when the scale parameters are unequal -- Comparison of two variances.".
- catalog extent "ix, 321 p. :".
- catalog hasFormat "Robust inference.".
- catalog identifier "0824775325".
- catalog isFormatOf "Robust inference.".
- catalog isPartOf "Statistics, textbooks and monographs ; v. 71.".
- catalog isPartOf "Statistics, textbooks and monographs ; vol. 71".
- catalog issued "1986".
- catalog issued "c1986.".
- catalog language "eng".
- catalog publisher "New York : M. Dekker,".
- catalog relation "Robust inference.".
- catalog subject "Estimation theory.".
- catalog subject "Nonparametric statistics.".
- catalog subject "QA276 .T52 1986".
- catalog subject "Robust statistics.".
- catalog tableOfContents "Robustness of Some Classical Tests -- Student's t test -- Asymptotic robustness of the t test -- Variance-ratio test for comparing several means -- Asymptotic robustness of the variance-ratio test -- Small-sample distributions of t and F under nonnormal distributions and robustness -- Small-sample null distribution of F and type I robustness -- Small-sample power of the t test and the F test -- Testing equality of two variances -- Laguerre polynomial expansion of nonnegative random variables -- Estimation Procedures for Censored Samples -- Type II censoring -- Truncated distributions and their cumulants -- Estimation of parameters from type II censored samples -- Least-squares estimators (BLUEs) -- Maximum likelihood estimators (MLEs) -- MMLEs for the normal -- Robust estimators and comparisons with the MMLEs -- Random choice of the proportion of censoring -- Adaptive estimators of location -- Order statistics -- MMLEs for Other Distributions -- MMLE for log-normal distribution -- MMLE for the logistic distribution -- Estimation of parameters of exponential distribution -- MML estimation of parameters for Rayleigh distribution -- MML estimation in progressively censored samples -- MML estimation for truncated distributions -- Robust Tests -- Robust Studentized one-sample tests -- Testing equality of two location parameters when scale parameters are equal -- Testing equality of location parameters of extreme skew distributions -- Comparison of two location parameters when the scale parameters are unequal -- Comparison of two variances.".
- catalog title "Robust inference / M.L. Tiku, W.Y. Tan, N. Balakrishnan.".
- catalog type "text".