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- catalog contributor b1276437.
- catalog created "c1982.".
- catalog date "1982".
- catalog date "c1982.".
- catalog dateCopyrighted "c1982.".
- catalog description "Includes bibliographical references and indexes.".
- catalog extent "xiv, 793 p. :".
- catalog hasFormat "Electron and ion microscopy and microanalysis.".
- catalog identifier "0824715535".
- catalog isFormatOf "Electron and ion microscopy and microanalysis.".
- catalog isPartOf "Optical engineering (Marcel Dekker, Inc.) ; v. 1.".
- catalog isPartOf "Optical engineering ; v. 1".
- catalog issued "1982".
- catalog issued "c1982.".
- catalog language "eng".
- catalog publisher "New York : Marcel Dekker,".
- catalog relation "Electron and ion microscopy and microanalysis.".
- catalog subject "Electron microscopy.".
- catalog subject "Field ion microscopes.".
- catalog subject "Field ion microscopy.".
- catalog subject "Microprobe analysis.".
- catalog subject "QH212.E4 M87 1982".
- catalog title "Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.".
- catalog type "text".