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- catalog contributor b2278925.
- catalog contributor b2278926.
- catalog created "c1985.".
- catalog date "1985".
- catalog date "c1985.".
- catalog dateCopyrighted "c1985.".
- catalog description "Atomic ordering of materials and chemical bonding analysis materials -- Microstructures of materials and elemental analysis -- Materials characteriation with ion beams -- High energy methods and materials chracterization using phooton beams.".
- catalog description "Includes bibliographies and indexes.".
- catalog extent "xiii, 483 p. :".
- catalog identifier "0931837138 :".
- catalog isPartOf "Materials Research Society symposia proceedings, 0272-9172 ; v. 48".
- catalog issued "1985".
- catalog issued "c1985.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Pa. : Materials Research Society,".
- catalog subject "620.1/1/0287 19".
- catalog subject "Materials Analysis Congresses.".
- catalog subject "Materials Testing Congresses.".
- catalog subject "TA410 .A67 1985".
- catalog tableOfContents "Atomic ordering of materials and chemical bonding analysis materials -- Microstructures of materials and elemental analysis -- Materials characteriation with ion beams -- High energy methods and materials chracterization using phooton beams.".
- catalog title "Applied materials characterization : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, W. Katz, P. Williams.".
- catalog type "Conference proceedings. fast".
- catalog type "text".