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- catalog contributor b4690659.
- catalog contributor b4690660.
- catalog created "[1965, c1964]".
- catalog date "1965".
- catalog date "[1965, c1964]".
- catalog dateCopyrighted "[1965, c1964]".
- catalog description "Includes bibliographical references.".
- catalog extent "vi, 89 p.".
- catalog isPartOf "ASTM special technical publication no. 372".
- catalog issued "1965".
- catalog issued "[1965, c1964]".
- catalog language "eng".
- catalog publisher "Philadelphia, American Society for Testing and Materials".
- catalog subject "669.95082".
- catalog subject "Electron microscopes Congresses.".
- catalog subject "Metallography Congresses.".
- catalog subject "TN690 .S896 1963".
- catalog title "Techniques of electron microscopy, diffraction, and microprobe analysis. Presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963.".
- catalog type "text".