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- catalog contributor b9475276.
- catalog contributor b9475277.
- catalog contributor b9475278.
- catalog contributor b9475279.
- catalog created "1995.".
- catalog date "1995".
- catalog date "1995.".
- catalog dateCopyrighted "1995.".
- catalog description "Includes bibliographical references (p. 14).".
- catalog extent "iv, 88 p. :".
- catalog isPartOf "NIST special publication ; 400-97".
- catalog isPartOf "Semiconductor measurement technology".
- catalog issued "1995".
- catalog issued "1995.".
- catalog language "eng".
- catalog publisher "Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington : For sale by the Supt. of Docs., U.S. G.P.O.,".
- catalog subject "Computer-aided design.".
- catalog subject "Gallium arsenide semiconductors Design Data processing.".
- catalog subject "Microwave integrated circuits Design Data processing.".
- catalog title "Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory.".
- catalog type "text".