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- 00028177 contributor B17887.
- 00028177 created "c2000.".
- 00028177 date "2000".
- 00028177 date "c2000.".
- 00028177 dateCopyrighted "c2000.".
- 00028177 description "Includes bibliographical references and indexes.".
- 00028177 extent "xi, 333 p. :".
- 00028177 identifier "1558994963".
- 00028177 identifier 00028177-d.html.
- 00028177 isPartOf "Materials Research Society symposia proceedings ; v. 588.".
- 00028177 isPartOf "Materials Research Society symposium proceedings, 0272-9172 ; v. 588".
- 00028177 issued "2000".
- 00028177 issued "c2000.".
- 00028177 language "eng".
- 00028177 publisher "Warrendale, Pa. : Materials Research Society,".
- 00028177 subject "621.3815/2 21".
- 00028177 subject "Microstructure Congresses.".
- 00028177 subject "QC610.9 .O67 2000".
- 00028177 subject "Semiconductors Congresses.".
- 00028177 title "Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. / editors, M. Selim Ünlü ... [et al.].".
- 00028177 type "text".