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- 00049275 contributor B42513.
- 00049275 contributor B42514.
- 00049275 created "2001.".
- 00049275 date "2001".
- 00049275 date "2001.".
- 00049275 dateCopyrighted "2001.".
- 00049275 description "Includes bibliographical references and index.".
- 00049275 extent "xix, 748 p. :".
- 00049275 identifier "3540678417 (alk. paper)".
- 00049275 issued "2001".
- 00049275 issued "2001.".
- 00049275 language "eng".
- 00049275 publisher "Berlin ; New York : Springer,".
- 00049275 subject "620.1/1299 21".
- 00049275 subject "Materials Microscopy.".
- 00049275 subject "TA417.23 .F85 2001".
- 00049275 subject "Transmission electron microscopy.".
- 00049275 subject "X-ray diffractometer.".
- 00049275 title "Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe.".
- 00049275 type "text".