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- 00710838 alternative "Testing, packaging, and reliability of semiconductor lasers V".
- 00710838 contributor B291729.
- 00710838 contributor B291730.
- 00710838 created "c2000.".
- 00710838 date "2000".
- 00710838 date "c2000.".
- 00710838 dateCopyrighted "c2000.".
- 00710838 description "Includes bibliographic references and author index.".
- 00710838 extent "viii, 320 p. :".
- 00710838 identifier "0819435627".
- 00710838 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3945.".
- 00710838 isPartOf "SPIE proceedings series ; v. 3945".
- 00710838 issued "2000".
- 00710838 issued "c2000.".
- 00710838 language "eng".
- 00710838 publisher "Bellingham, Washington : SPIE,".
- 00710838 subject "621.36/6 21".
- 00710838 subject "Diodes, Semiconductor Congresses.".
- 00710838 subject "Semiconductor lasers Congresses.".
- 00710838 subject "Semiconductor lasers Industrial applications Congresses.".
- 00710838 subject "TA1700 .L3623 2000".
- 00710838 title "Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II : Testing, packaging, and reliability of semiconductor lasers V : 26-26[sic], January, 2000, San Jose, California / Geoffrey T. Burnham ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- 00710838 title "Testing, packaging, and reliability of semiconductor lasers V".
- 00710838 type "text".