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- 2001273202 contributor B8990368.
- 2001273202 contributor B8990369.
- 2001273202 created "c2000.".
- 2001273202 date "2000".
- 2001273202 date "c2000.".
- 2001273202 dateCopyrighted "c2000.".
- 2001273202 description "Includes bibliographical references and index.".
- 2001273202 extent "viii, 314 p. :".
- 2001273202 identifier "0819437433".
- 2001273202 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4098.".
- 2001273202 isPartOf "SPIE proceedings series ; v. 4098".
- 2001273202 issued "2000".
- 2001273202 issued "c2000.".
- 2001273202 language "eng".
- 2001273202 publisher "Bellingham, Wash., USA : SPIE,".
- 2001273202 subject "620.1/1/0287 21".
- 2001273202 subject "Light Scattering Congresses.".
- 2001273202 subject "Nanostructured materials Testing Congresses.".
- 2001273202 subject "Near-field microscopy Industrial applications Congresses.".
- 2001273202 subject "Optical materials Testing Congresses.".
- 2001273202 subject "Optoelectronic devices Congresses.".
- 2001273202 subject "Raman spectroscopy Industrial applications Congresses.".
- 2001273202 subject "TA418.9.N35 O388 2000".
- 2001273202 title "Optical devices and diagnostics in materials science : 1-4 August 2000, San Diego, USA / David L. Andrews ... [et al.] ; sponsored ... by SPIE--the International Society for Optical Engineering.".
- 2001273202 type "text".