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- 2001277780 contributor B8995969.
- 2001277780 created "c2001.".
- 2001277780 date "2001".
- 2001277780 date "c2001.".
- 2001277780 dateCopyrighted "c2001.".
- 2001277780 description "Includes bibliographical references and index.".
- 2001277780 extent "xiii, 441 p. :".
- 2001277780 identifier "3908450616".
- 2001277780 isPartOf "Diffusion and defect data--solid state data. Pt. B, Solid state phenomena, 1012-0394 ; v. 78-79".
- 2001277780 isPartOf "Diffusion and defect data. Pt. B, Solid state phenomena ; v. 78-79.".
- 2001277780 issued "2001".
- 2001277780 issued "c2001.".
- 2001277780 language "eng".
- 2001277780 publisher "Uetikon-Zuerich, Switzerland : Scitec Publications,".
- 2001277780 subject "621.3815/2 21".
- 2001277780 subject "Semiconductors Defects Congresses.".
- 2001277780 subject "Semiconductors Microscopy Congresses.".
- 2001277780 subject "Semiconductors Testing Congresses.".
- 2001277780 subject "TK7871.85 .I584365 2001".
- 2001277780 title "Beam injection assessment of microstructures in semiconductors : BIAMS 2000 : proceedings of the 6th International Workshop on Beam Injection Assessment of Mictrostructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 / editors: Hajime Tomokage and Takashi Sekiguchi.".
- 2001277780 type "text".