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- 2002043306 contributor B9234075.
- 2002043306 contributor B9234076.
- 2002043306 created "c2003.".
- 2002043306 date "2003".
- 2002043306 date "c2003.".
- 2002043306 dateCopyrighted "c2003.".
- 2002043306 description "Includes bibliographical references (p. 163-173) and index.".
- 2002043306 extent "xi, 178 p. :".
- 2002043306 identifier "140207235X (alk. paper)".
- 2002043306 identifier 2002043306-d.html.
- 2002043306 identifier 2002043306.html.
- 2002043306 isPartOf "Frontiers in electronic testing ; 22".
- 2002043306 issued "2003".
- 2002043306 issued "c2003.".
- 2002043306 language "eng".
- 2002043306 publisher "Boston : Kluwer Academic Publishers,".
- 2002043306 subject "621.39/5/0287 21".
- 2002043306 subject "Integrated circuits, Very large scale integration Protection.".
- 2002043306 subject "Integrated circuits, Very large scale integration Testing.".
- 2002043306 subject "Semiconductors Thermal properties.".
- 2002043306 subject "TK7874.75 .N53 2003".
- 2002043306 title "Power-constrained testing of VLSI circuits / by Nicola Nicolici and Bashir M. Al-Hashimi.".
- 2002043306 type "text".