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- 2002115878 contributor B9260662.
- 2002115878 contributor B9260663.
- 2002115878 contributor B9260664.
- 2002115878 created "c2003.".
- 2002115878 date "2003".
- 2002115878 date "c2003.".
- 2002115878 dateCopyrighted "c2003.".
- 2002115878 description "Includes bibliographical references.".
- 2002115878 extent "xi, 359 p. :".
- 2002115878 identifier "0873395352".
- 2002115878 issued "2003".
- 2002115878 issued "c2003.".
- 2002115878 language "eng".
- 2002115878 publisher "Warrendale, Pa. : TMS,".
- 2002115878 subject "620.1/1299 21".
- 2002115878 subject "Electron microscopy.".
- 2002115878 subject "Materials Analysis.".
- 2002115878 subject "Materials Microscopy.".
- 2002115878 subject "QH212.E4 M567 2003".
- 2002115878 title "Electron microscopy : its role in materials science : the Mike Meshii Symposium : proceedings of a symposia sponsored by the Mechanical Behavior of Materials Committee (Jt. ASM-MSCTS) of the Structural Materials Division (SMD) of TMS (The Minerals, Metals & Materials Society) with the Japan Institute of Metals : 2003 TMS Annual Meeting, San Diego, California, March 2-6, 2003 / edited by J.R. Weertman ... [et al.].".
- 2002115878 type "text".