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- 2002265757 alternative "GADEST 2001".
- 2002265757 alternative "Gettering and defect engineering in semiconductor technology".
- 2002265757 contributor B9271639.
- 2002265757 contributor B9271638.
- 2002265757 created "c2002.".
- 2002265757 date "2002".
- 2002265757 date "c2002.".
- 2002265757 dateCopyrighted "c2002.".
- 2002265757 description "Includes bibliographical references and index.".
- 2002265757 extent "xviii, 823 p. :".
- 2002265757 identifier "3908450640".
- 2002265757 isPartOf "Diffusion and defect data. Pt. B, Solid state phenomena, 1012-0394 ; v. 82/84".
- 2002265757 issued "2002".
- 2002265757 issued "c2002.".
- 2002265757 language "eng".
- 2002265757 publisher "Uetikon-Zürich, Switzerland : Sci-Tech Pub. Ltd. ; Enfield, N.H. : Trans Tech Pub. Ltd. [distributor],".
- 2002265757 subject "621.3815/2 21".
- 2002265757 subject "Electrical engineering Materials Congresses.".
- 2002265757 subject "Getters Congresses.".
- 2002265757 subject "Semiconductors Defects Congresses.".
- 2002265757 subject "Silicon crystals Defects Congresses.".
- 2002265757 subject "TK7871.85 .I574 2001".
- 2002265757 title "GADEST 2001".
- 2002265757 title "Gettering and defect engineering in semiconductor technology".
- 2002265757 title "Proceedings of the 9th International Autumn Meeting Gettering and defect engineering in semiconductor technology : GADEST 2001, S. Tecla, Italy, September 30-October 3, 2001 / editors, V. Raineri ... [et al.].".
- 2002265757 type "text".