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- 2002277950 alternative "Laser metrology 1999".
- 2002277950 contributor B9275456.
- 2002277950 contributor B9275457.
- 2002277950 contributor B9275458.
- 2002277950 created "c2001.".
- 2002277950 date "2001".
- 2002277950 date "c2001.".
- 2002277950 dateCopyrighted "c2001.".
- 2002277950 description "Includes bibliographical references and index.".
- 2002277950 extent "xv, 204 p. :".
- 2002277950 identifier "0819441279".
- 2002277950 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4420.".
- 2002277950 isPartOf "SPIE proceedings series, 0277-786X ; v. 4420".
- 2002277950 issued "2001".
- 2002277950 issued "c2001.".
- 2002277950 language "eng".
- 2002277950 publisher "Bellingham, Wash., USA : SPIE,".
- 2002277950 subject "670.42/5 21".
- 2002277950 subject "Laser interferometers Congresses.".
- 2002277950 subject "Measurement Congresses.".
- 2002277950 subject "Optical measurements Congresses.".
- 2002277950 subject "TA1673 .L36458 2001".
- 2002277950 title "Laser metrology 1999".
- 2002277950 title "Laser metrology for precision measurement and inspection in industry : 13-15 October 1999, Florianópolis, Brazil / Armando Albertazzi, Jr., editor ; promoted by IMEKO--the International Measurement Confederation, Brazilian Society of Metrology, [and] SPIE--the International Society for Optical Engineering.".
- 2002277950 type "text".