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- 2003097066 contributor B9563046.
- 2003097066 created "c2004.".
- 2003097066 date "2004".
- 2003097066 date "c2004.".
- 2003097066 dateCopyrighted "c2004.".
- 2003097066 description "Includes bibliographical references (p. 105-107) and index.".
- 2003097066 extent "viii, 113 p. :".
- 2003097066 identifier "0964145529".
- 2003097066 issued "2004".
- 2003097066 issued "c2004.".
- 2003097066 language "eng".
- 2003097066 publisher "Rocky Hill, NJ : Princeton Gamma-Tech,".
- 2003097066 subject "502/.8/25 22".
- 2003097066 subject "Electron microscopy.".
- 2003097066 subject "Image processing Digital techniques.".
- 2003097066 subject "QH212.E4 F75 2004".
- 2003097066 subject "X-ray microanalysis.".
- 2003097066 title "X-ray and image analysis in electron microscopy / John J. Friel.".
- 2003097066 type "text".