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- 2003114789 alternative "2004 International Conference on Microelectronic Test Structures".
- 2003114789 alternative "Microelectronic test structures".
- 2003114789 contributor B9575398.
- 2003114789 contributor B9575399.
- 2003114789 created "c2004.".
- 2003114789 date "2004".
- 2003114789 date "c2004.".
- 2003114789 dateCopyrighted "c2004.".
- 2003114789 description "Includes bibliographic references and author index.".
- 2003114789 extent "xii, 313 p. :".
- 2003114789 hasFormat "Also available via the World Wide Web.".
- 2003114789 identifier "0780382625".
- 2003114789 isFormatOf "Also available via the World Wide Web.".
- 2003114789 issued "2004".
- 2003114789 issued "c2004.".
- 2003114789 language "eng".
- 2003114789 publisher "Piscataway, New Jersey : IEEE,".
- 2003114789 relation "Also available via the World Wide Web.".
- 2003114789 subject "Electronic apparatus and appliances Testing Congresses.".
- 2003114789 subject "Integrated circuits Testing Congresses.".
- 2003114789 subject "Semiconductors Testing Congresses.".
- 2003114789 subject "TK7874 .I3233 2004".
- 2003114789 title "2004 International Conference on Microelectronic Test Structures".
- 2003114789 title "ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan / sponsored by the IEEE Electron Devices Society.".
- 2003114789 title "Microelectronic test structures".
- 2003114789 type "text".