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- 2005047881 contributor B10158646.
- 2005047881 contributor B10158647.
- 2005047881 created "c2005.".
- 2005047881 date "2005".
- 2005047881 date "c2005.".
- 2005047881 dateCopyrighted "c2005.".
- 2005047881 description "Includes bibliographical references (p. 227-229) and index.".
- 2005047881 extent "xiv, 237 p. :".
- 2005047881 identifier "007144372X (alk. paper)".
- 2005047881 identifier 2005047881-b.html.
- 2005047881 identifier 2005047881-d.html.
- 2005047881 identifier 2005047881-t.html.
- 2005047881 isPartOf "McGraw-Hill electronic engineering series.".
- 2005047881 isPartOf "McGraw-Hill electronic engineering".
- 2005047881 issued "2005".
- 2005047881 issued "c2005.".
- 2005047881 language "eng".
- 2005047881 publisher "New York : McGraw-Hill,".
- 2005047881 subject "621.3815 22".
- 2005047881 subject "Electronic circuits Testing.".
- 2005047881 subject "Integrated circuits Verification.".
- 2005047881 subject "TK7874.58 .P47 2005".
- 2005047881 title "Applied formal verification / Douglas L. Perry, Harry D. Foster.".
- 2005047881 type "text".