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- 2005295430 alternative "ETW 2003".
- 2005295430 alternative "IEEE European Test Workshop".
- 2005295430 contributor B10188955.
- 2005295430 contributor B10188956.
- 2005295430 created "c2003.".
- 2005295430 date "2003".
- 2005295430 date "c2003.".
- 2005295430 dateCopyrighted "c2003.".
- 2005295430 description "Includes bibliographical references and index.".
- 2005295430 extent "xii, 161 p. :".
- 2005295430 identifier "0769519083".
- 2005295430 identifier opac?punumber=8721.
- 2005295430 issued "2003".
- 2005295430 issued "c2003.".
- 2005295430 language "eng".
- 2005295430 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 2005295430 subject "621.3815 22".
- 2005295430 subject "Integrated circuits Testing Congresses.".
- 2005295430 subject "TK7874 .I324 2003".
- 2005295430 title "ETW 2003".
- 2005295430 title "Eighth IEEE European Test Workshop : proceedings : 25-28 May 2003, Maastricht, the Netherlands / sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; organized by Philips Research.".
- 2005295430 title "IEEE European Test Workshop".
- 2005295430 type "text".