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- 2005924717 contributor B10393763.
- 2005924717 created "c2005.".
- 2005924717 date "2005".
- 2005924717 date "c2005.".
- 2005924717 dateCopyrighted "c2005.".
- 2005924717 description "Includes bibliographical references (p. [195]-196) and index.".
- 2005924717 extent "xii, 202 p. :".
- 2005924717 identifier "0387258000".
- 2005924717 identifier 2005924717-d.html.
- 2005924717 identifier 2005924717.html.
- 2005924717 issued "2005".
- 2005924717 issued "c2005.".
- 2005924717 language "eng".
- 2005924717 publisher "New York, NY : Springer,".
- 2005924717 subject "Electron microscopy.".
- 2005924717 subject "QH212.E4 E354 2005".
- 2005924717 title "Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / Ray F. Egerton.".
- 2005924717 type "text".