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- 2006280338 alternative "IEEE International Test Conference (ITC)".
- 2006280338 alternative "International Test Conference (ITC)".
- 2006280338 contributor B10484046.
- 2006280338 contributor B10484047.
- 2006280338 created "c2005".
- 2006280338 date "2005".
- 2006280338 date "c2005".
- 2006280338 dateCopyrighted "c2005".
- 2006280338 description "Includes bibliographical references and index.".
- 2006280338 extent "2 v. (viii, 1323 p.) :".
- 2006280338 hasFormat "Also issued online with additional title: Test Conference, 2005, proceedings, ITC 2005, IEEE International.".
- 2006280338 identifier "0780390385 (set)".
- 2006280338 identifier opac?punumber=10560.
- 2006280338 isFormatOf "Also issued online with additional title: Test Conference, 2005, proceedings, ITC 2005, IEEE International.".
- 2006280338 issued "2005".
- 2006280338 issued "c2005".
- 2006280338 language "eng".
- 2006280338 publisher "Piscataway, N.J. : Institute of Electrical and Electronics Engineers,".
- 2006280338 relation "Also issued online with additional title: Test Conference, 2005, proceedings, ITC 2005, IEEE International.".
- 2006280338 subject "621.3815/48 22".
- 2006280338 subject "Electronics Congresses.".
- 2006280338 subject "Integrated circuits Testing Congresses.".
- 2006280338 subject "Semiconductors Testing Congresses.".
- 2006280338 subject "TK7874 .I474 2005".
- 2006280338 title "2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX.".
- 2006280338 title "IEEE International Test Conference (ITC)".
- 2006280338 title "International Test Conference (ITC)".
- 2006280338 type "text".