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- 2008422016 contributor B11275916.
- 2008422016 created "2004.".
- 2008422016 date "2004".
- 2008422016 date "2004.".
- 2008422016 dateCopyrighted "2004.".
- 2008422016 description "Includes bibliographical references (p. 191-194).".
- 2008422016 extent "x, 194 p. :".
- 2008422016 identifier "3183386208 (pbk.)".
- 2008422016 identifier "9783183386208 (pbk.)".
- 2008422016 isPartOf "Fortschritt-Berichte VDI. Reihe 20, Rechnerunterstützte Verfahren, 0178-9473 ; Nr. 386".
- 2008422016 issued "2004".
- 2008422016 issued "2004.".
- 2008422016 language "ger".
- 2008422016 publisher "Düsseldorf : VDI-Verlag,".
- 2008422016 subject "Integrated circuits; testing".
- 2008422016 subject "MLCS 2010/42510 (T)".
- 2008422016 title "Methoden zur rechnergestützten zeitbezogenen Analyse und Optimierung von Testabläufen beim Test integrierter Schaltungen / Heiko Beyer.".
- 2008422016 type "text".