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- 2008924192 contributor B11379128.
- 2008924192 contributor B11379129.
- 2008924192 created "c2008.".
- 2008924192 date "2008".
- 2008924192 date "c2008.".
- 2008924192 dateCopyrighted "c2008.".
- 2008924192 description "Includes bibliographical references and index.".
- 2008924192 extent "xvi, 193 p. :".
- 2008924192 identifier "9781402083624 (hbk.)".
- 2008924192 identifier "9781402083631 (e-book)".
- 2008924192 identifier 2008924192.html.
- 2008924192 isPartOf "Frontiers in electronic testing ; 40".
- 2008924192 issued "2008".
- 2008924192 issued "c2008.".
- 2008924192 language "eng".
- 2008924192 publisher "[Dordrecht] : Springer,".
- 2008924192 subject "621.38152 22".
- 2008924192 subject "Metal oxide semiconductors, Complementary Design.".
- 2008924192 subject "Nanoelectronics.".
- 2008924192 subject "Random access memory.".
- 2008924192 subject "TK7871.99.M44 P38 2008".
- 2008924192 title "CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test / Andrei Pavlov, Manoj Sachdev.".
- 2008924192 type "text".