Matches in Library of Congress for { <http://lccn.loc.gov/2009908727> ?p ?o. }
Showing items 1 to 22 of
22
with 100 items per page.
- 2009908727 contributor B11719846.
- 2009908727 contributor B11719847.
- 2009908727 created "2009.".
- 2009908727 date "2009".
- 2009908727 date "2009.".
- 2009908727 dateCopyrighted "2009.".
- 2009908727 description "Includes bibliographical references and indexes.".
- 2009908727 extent "xii, 398 p. :".
- 2009908727 identifier "0735407126 (hbk.)".
- 2009908727 identifier "9780735407121 (hbk.)".
- 2009908727 isPartOf "AIP conference proceedings ; no. 1173.".
- 2009908727 isPartOf "AIP conference proceedings, 0094-243X ; v. 1173".
- 2009908727 issued "2009".
- 2009908727 issued "2009.".
- 2009908727 language "eng".
- 2009908727 publisher "Melville, N.Y. : AIP Conference Proceedings,".
- 2009908727 subject "621.3815 22".
- 2009908727 subject "Integrated circuits Ultra large scale integration Congresses Software.".
- 2009908727 subject "Integrated circuits Ultra large scale integration Congresses.".
- 2009908727 subject "TK7874.76 .I565 2009".
- 2009908727 title "Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New York, 11-15 May 2009 / editors, David G. Seiler ... [et al.]".
- 2009908727 type "text".