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- 2011935503 contributor B12420904.
- 2011935503 created "2011.".
- 2011935503 date "2011".
- 2011935503 date "2011.".
- 2011935503 dateCopyrighted "2011.".
- 2011935503 description "Includes bibliographical references and index.".
- 2011935503 extent "xi, 282 p. :".
- 2011935503 identifier "1845699343".
- 2011935503 identifier "9781845699345".
- 2011935503 identifier 2011935503-b.html.
- 2011935503 identifier 2011935503-d.html.
- 2011935503 identifier 2011935503-t.html.
- 2011935503 isPartOf "Woodhead Publishing in materials".
- 2011935503 isPartOf "Woodhead Publishing in materials.".
- 2011935503 issued "2011".
- 2011935503 issued "2011.".
- 2011935503 language "eng".
- 2011935503 publisher "Cambridge ; Philadelphia, PA : Woodhead Publishing,".
- 2011935503 subject "530.4/275 23".
- 2011935503 subject "Crystal growth.".
- 2011935503 subject "TA418.9.T45 I53 2011".
- 2011935503 subject "Thin films Analysis.".
- 2011935503 title "In-situ characterization of thin film growth / edited by Gertjan Koster and Guus Rijnders.".
- 2011935503 type "text".