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- 2012949821 contributor B12704917.
- 2012949821 contributor B12704918.
- 2012949821 created "c2013.".
- 2012949821 date "2013".
- 2012949821 date "c2013.".
- 2012949821 dateCopyrighted "c2013.".
- 2012949821 description "Includes bibliographical references 9P. 736-745) and index.".
- 2012949821 extent "xx, 761 p. :".
- 2012949821 identifier "3642297609 (alk. paper)".
- 2012949821 identifier "9783642297601 (alk. paper)".
- 2012949821 identifier "9783642297618 (ebk.)".
- 2012949821 isPartOf "Graduate texts in physics, 1868-4513".
- 2012949821 isPartOf "Graduate texts in physics.".
- 2012949821 issued "2013".
- 2012949821 issued "c2013.".
- 2012949821 language "eng".
- 2012949821 publisher "Heidelberg ; New York : Springer,".
- 2012949821 subject "Materials Microscopy.".
- 2012949821 subject "TA417.23 .F85 2013".
- 2012949821 subject "Transmission electron microscopy.".
- 2012949821 subject "X-ray diffractometer.".
- 2012949821 title "Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe.".
- 2012949821 type "text".