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- 63021661 contributor B1558059.
- 63021661 contributor B1558060.
- 63021661 created "[1964]".
- 63021661 date "1964".
- 63021661 date "[1964]".
- 63021661 dateCopyrighted "[1964]".
- 63021661 description "Includes bibliographies.".
- 63021661 extent "vi, 209 p.".
- 63021661 isPartOf "ASTM special technical publication no. 349".
- 63021661 isPartOf "American Society for Testing and Materials. Special technical publication ; no. 349.".
- 63021661 issued "1964".
- 63021661 issued "[1964]".
- 63021661 language "eng".
- 63021661 publisher "Philadelphia, American Society for Testing and Materials".
- 63021661 subject "544.6".
- 63021661 subject "Probes (Electronic instruments) Congresses.".
- 63021661 subject "QD95 .S95 1963".
- 63021661 subject "X-ray spectroscopy Congresses.".
- 63021661 title "Symposium on X-Ray and Electron Probe Analysis; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.".
- 63021661 type "text".