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- 74189005%2F%2Fr922 contributor B2485775.
- 74189005%2F%2Fr922 contributor B2485776.
- 74189005%2F%2Fr922 created "[1972]".
- 74189005%2F%2Fr922 date "1972".
- 74189005%2F%2Fr922 date "[1972]".
- 74189005%2F%2Fr922 dateCopyrighted "[1972]".
- 74189005%2F%2Fr922 description "Bibliography: p. 75-[80]".
- 74189005%2F%2Fr922 extent "79, [1] p.".
- 74189005%2F%2Fr922 isPartOf "ASTM special technical publication 506".
- 74189005%2F%2Fr922 isPartOf "ASTM special technical publication ; 506.".
- 74189005%2F%2Fr922 issued "1972".
- 74189005%2F%2Fr922 issued "[1972]".
- 74189005%2F%2Fr922 language "eng".
- 74189005%2F%2Fr922 publisher "Philadelphia, American Society for Testing and Materials".
- 74189005%2F%2Fr922 subject "543/.081".
- 74189005%2F%2Fr922 subject "Electron microscopy.".
- 74189005%2F%2Fr922 subject "Electron probe microanalysis.".
- 74189005%2F%2Fr922 subject "Microchemistry.".
- 74189005%2F%2Fr922 subject "QD98 .B32".
- 74189005%2F%2Fr922 title "Electron beam microanalysis by D. R. Beaman and J. A. Isasi.".
- 74189005%2F%2Fr922 type "text".