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- 76608059 contributor B2992592.
- 76608059 created "1976.".
- 76608059 date "1976".
- 76608059 date "1976.".
- 76608059 dateCopyrighted "1976.".
- 76608059 description "Bibliography: p. 14.".
- 76608059 extent "iii, 14 p. :".
- 76608059 isPartOf "NBS special publication ; 400-26".
- 76608059 isPartOf "NBS special publication ; 400-26.".
- 76608059 isPartOf "Semiconductor measurement technology".
- 76608059 issued "1976".
- 76608059 issued "1976.".
- 76608059 language "eng".
- 76608059 publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 76608059 subject "602/.1 s 621.3815/28".
- 76608059 subject "Capacitors Defects.".
- 76608059 subject "Cryostats.".
- 76608059 subject "Electric measurements.".
- 76608059 subject "QC100 .U57 no. 400-26 TK7871.85".
- 76608059 subject "Semiconductors Junctions Defects.".
- 76608059 title "Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script / Martin G. Buehler.".
- 76608059 type "text".