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- 83600571 contributor B4590989.
- 83600571 created "[1983]".
- 83600571 date "1983".
- 83600571 date "[1983]".
- 83600571 dateCopyrighted "[1983]".
- 83600571 description "Includes bibliographical references (p. 86-98).".
- 83600571 extent "xiii, 136 p. ;".
- 83600571 isPartOf "NBS special publication ; 260-85".
- 83600571 isPartOf "Standard reference materials".
- 83600571 issued "1983".
- 83600571 issued "[1983]".
- 83600571 language "eng".
- 83600571 publisher "Washington, DC : U.S. Dept. of Commerce, National Bureau of Standards,".
- 83600571 subject "Calibration.".
- 83600571 subject "Electron microscopy.".
- 83600571 subject "Particle size determination.".
- 83600571 subject "QC100 .U57 no. 260-85 QH212.E4".
- 83600571 title "A look at techniques for the dimensional calibration of standard microscopic particles / Dennis A. Swyt.".
- 83600571 type "text".