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- 97072002 alternative "6th International Symposium on the Physical & Failure Analysis of Integrated Circuites".
- 97072002 alternative "6th International Symposium on the Physical & Failure Analysis of Integrated Circuits".
- 97072002 alternative "IPFA '97".
- 97072002 contributor B8091253.
- 97072002 contributor B8091254.
- 97072002 contributor B8091255.
- 97072002 created "1997.".
- 97072002 date "1997".
- 97072002 date "1997.".
- 97072002 dateCopyrighted "1997.".
- 97072002 description "Includes bibliographic references and author index.".
- 97072002 extent "[xi], 301, [5] p. :".
- 97072002 identifier "0780339851 (softbound)".
- 97072002 issued "1997".
- 97072002 issued "1997.".
- 97072002 language "eng".
- 97072002 publisher "Piscataway, NJ : Institute of Electrical and Electronics Engineers,".
- 97072002 subject "621.3815 21".
- 97072002 subject "Integrated circuits Defects Congresses.".
- 97072002 subject "Integrated circuits Testing Congresses.".
- 97072002 subject "TK7874 .I59248 1997".
- 97072002 title "6th International Symposium on the Physical & Failure Analysis of Integrated Circuites".
- 97072002 title "6th International Symposium on the Physical & Failure Analysis of Integrated Circuits".
- 97072002 title "IPFA '97".
- 97072002 title "Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore] / edited by M.K. Radhakrishnan, Philip Ho, Chim Wai Kin ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter ... [et al.].".
- 97072002 type "text".