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- 99058788 contributor B8683858.
- 99058788 contributor B8683859.
- 99058788 created "c1999.".
- 99058788 date "1999".
- 99058788 date "c1999.".
- 99058788 dateCopyrighted "c1999.".
- 99058788 description "Includes bibliographical references and indexes.".
- 99058788 extent "xvii, 632 p. :".
- 99058788 identifier "0750305770".
- 99058788 identifier 99058788-d.html.
- 99058788 isPartOf "Institute of Physics conference series ; no. 161".
- 99058788 issued "1999".
- 99058788 issued "c1999.".
- 99058788 language "eng".
- 99058788 publisher "Bristol ; Philadelphia : Institute of Physics Pub.,".
- 99058788 subject "502/.8/25 21".
- 99058788 subject "Electron microscopy Congresses.".
- 99058788 subject "QH212.E4 E3798 1999".
- 99058788 title "Electron microscopy and analysis 1999 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999 / edited by C.J. Kiely.".
- 99058788 type "text".