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- aggregation classification "P1".
- aggregation creator person.
- aggregation creator person.
- aggregation creator person.
- aggregation date "2011".
- aggregation format "application/pdf".
- aggregation hasFormat 2032644.bibtex.
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- aggregation isPartOf urn:isbn:9780819486882.
- aggregation isPartOf urn:issn:0277-786X.
- aggregation language "eng".
- aggregation publisher "SPIE".
- aggregation rights "I have transferred the copyright for this publication to the publisher".
- aggregation subject "Technology and Engineering".
- aggregation title "Low dispersion integrated michelson interferometer on silicon on insulator for optical coherence tomography".
- aggregation abstract "We present an integrated silicon Michelson interferometer for OCT fabricated with wafer scale deep UV lithography. Silicon waveguides of the interferometer are designed with GVD less than 50 ps/nm. km. The footprint of the device is 0.5 mm x 3 mm. The effect of sidewall roughness of silicon waveguides has been observed, possible solutions are discussed.".
- aggregation authorList BK309071.
- aggregation volume "8091".
- aggregation aggregates 3146282.
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- aggregation isDescribedBy 2032644.
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