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- aggregation classification "A1".
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- aggregation date "2003".
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- aggregation isPartOf urn:issn:1063-8210.
- aggregation language "eng".
- aggregation publisher "IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC".
- aggregation subject "Technology and Engineering".
- aggregation title "A comparison of various terminal-gate relationships for interconnect prediction in VLSI circuits".
- aggregation authorList BK376156.
- aggregation endPage "34".
- aggregation issue "1".
- aggregation startPage "24".
- aggregation volume "11".
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