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- Automatic_test_pattern_generation abstract "ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, and in some cases to assist with determining the cause of failure (failure analysis.) The effectiveness of ATPG is measured by the amount of modeled defects, or fault models, that are detected and the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration. It is influenced by the fault model under consideration, the type of circuit under test (full scan, synchronous sequential, or asynchronous sequential), the level of abstraction used to represent the circuit under test (gate, register-transistor, switch), and the required test quality.".
- Automatic_test_pattern_generation wikiPageExternalLink www.date-conference.com.
- Automatic_test_pattern_generation wikiPageExternalLink www.ieee-ets.org.
- Automatic_test_pattern_generation wikiPageExternalLink www.itctestweek.org.
- Automatic_test_pattern_generation wikiPageExternalLink www.tttc-vts.org.
- Automatic_test_pattern_generation wikiPageID "374448".
- Automatic_test_pattern_generation wikiPageRevisionID "591090653".
- Automatic_test_pattern_generation hasPhotoCollection Automatic_test_pattern_generation.
- Automatic_test_pattern_generation subject Category:Electronic_circuit_verification.
- Automatic_test_pattern_generation comment "ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.".
- Automatic_test_pattern_generation label "ATPG".
- Automatic_test_pattern_generation label "Automatic test pattern generation".
- Automatic_test_pattern_generation label "Generazione di programmi di prova automatici".
- Automatic_test_pattern_generation sameAs Generazione_di_programmi_di_prova_automatici.
- Automatic_test_pattern_generation sameAs m.020vkj.
- Automatic_test_pattern_generation sameAs Q837455.
- Automatic_test_pattern_generation sameAs Q837455.
- Automatic_test_pattern_generation wasDerivedFrom Automatic_test_pattern_generation?oldid=591090653.
- Automatic_test_pattern_generation isPrimaryTopicOf Automatic_test_pattern_generation.