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- Bead_probe_technology abstract "Bead probe technology (BPT) is technique used to provide electrical access (called “nodal access”) to printed circuit board (PCB) circuitry for performing in-circuit testing (ICT). It makes use of small beads of solder placed onto the board's traces to allow measuring and controlling of the signals using a test probe. This permits test access to boards on which standard ICT test pads are not feasible due to space constraints.".
- Bead_probe_technology thumbnail BEAD_PROBE.JPG?width=300.
- Bead_probe_technology wikiPageID "13642299".
- Bead_probe_technology wikiPageRevisionID "593021594".
- Bead_probe_technology hasPhotoCollection Bead_probe_technology.
- Bead_probe_technology subject Category:Electronics_manufacturing.
- Bead_probe_technology subject Category:Hardware_testing.
- Bead_probe_technology comment "Bead probe technology (BPT) is technique used to provide electrical access (called “nodal access”) to printed circuit board (PCB) circuitry for performing in-circuit testing (ICT). It makes use of small beads of solder placed onto the board's traces to allow measuring and controlling of the signals using a test probe. This permits test access to boards on which standard ICT test pads are not feasible due to space constraints.".
- Bead_probe_technology label "Bead probe technology".
- Bead_probe_technology sameAs m.03ccst4.
- Bead_probe_technology sameAs Q4876056.
- Bead_probe_technology sameAs Q4876056.
- Bead_probe_technology wasDerivedFrom Bead_probe_technology?oldid=593021594.
- Bead_probe_technology depiction BEAD_PROBE.JPG.
- Bead_probe_technology isPrimaryTopicOf Bead_probe_technology.
