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- Chemical_force_microscopy abstract "Chemical force microscopy (CFM) is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces. With AFM, structural morphology is probed using simple tapping or contact modes that utilize van der Waals interactions between tip and sample to maintain a constant probe deflection amplitude (constant force mode) or maintain height while measuring tip deflection (constant height mode). CFM, on the other hand, uses chemical interactions between functionalized probe tip and sample. Choice chemistry is typically gold-coated tip and surface with R-SH thiols attached, R being the functional groups of interest. CFM enables the ability to determine the chemical nature of surfaces, irrespective of their specific morphology, and facilitates studies of basic chemical bonding enthalpy and surface energy. Typically, CFM is limited by thermal vibrations within the cantilever holding the probe. This limits force measurement resolution to ~1 pN which is still very suitable considering weak COOH/CH3 interactions are ~20 pN per pair. Hydrophobicity is used as the primary example throughout this consideration of CFM, but certainly any type of bonding can be probed with this method.".
- Chemical_force_microscopy thumbnail Figure1nnew.jpg?width=300.
- Chemical_force_microscopy wikiPageID "19855700".
- Chemical_force_microscopy wikiPageRevisionID "546963440".
- Chemical_force_microscopy hasPhotoCollection Chemical_force_microscopy.
- Chemical_force_microscopy subject Category:Microscopy.
- Chemical_force_microscopy subject Category:Scanning_probe_microscopy.
- Chemical_force_microscopy comment "Chemical force microscopy (CFM) is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces. With AFM, structural morphology is probed using simple tapping or contact modes that utilize van der Waals interactions between tip and sample to maintain a constant probe deflection amplitude (constant force mode) or maintain height while measuring tip deflection (constant height mode).".
- Chemical_force_microscopy label "Chemical force microscopy".
- Chemical_force_microscopy sameAs m.04q6nlg.
- Chemical_force_microscopy sameAs Q5090460.
- Chemical_force_microscopy sameAs Q5090460.
- Chemical_force_microscopy wasDerivedFrom Chemical_force_microscopy?oldid=546963440.
- Chemical_force_microscopy depiction Figure1nnew.jpg.
- Chemical_force_microscopy isPrimaryTopicOf Chemical_force_microscopy.
