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- Conductive_atomic_force_microscopy abstract "Conductive atomic force microscopy (C-AFM) is a variation of atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which uses electrical current to construct the surface profile of the studied sample. The current is flowing through the metal-coated tip of the microscope and the conducting sample. Usual AFM topography, obtained by vibrating the tip, is acquired simultaneously with the current. This enables to correlate a spatial feature on the sample with its conductivity, and distinguishes C-AFM from STM where only current is recorded. A C-AFM microscope uses conventional silicon tips coated with a metal or metallic alloy, such as Pt-Ir alloy.The C-AFM can be operated in the imaging mode and spectroscopic mode.".
- Conductive_atomic_force_microscopy wikiPageID "24580913".
- Conductive_atomic_force_microscopy wikiPageRevisionID "369160285".
- Conductive_atomic_force_microscopy hasPhotoCollection Conductive_atomic_force_microscopy.
- Conductive_atomic_force_microscopy subject Category:Microscopes.
- Conductive_atomic_force_microscopy subject Category:Scanning_probe_microscopy.
- Conductive_atomic_force_microscopy type Artifact100021939.
- Conductive_atomic_force_microscopy type Device103183080.
- Conductive_atomic_force_microscopy type Instrument103574816.
- Conductive_atomic_force_microscopy type Instrumentality103575240.
- Conductive_atomic_force_microscopy type Magnifier103709206.
- Conductive_atomic_force_microscopy type Microscope103760671.
- Conductive_atomic_force_microscopy type Microscopes.
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- Conductive_atomic_force_microscopy type PhysicalEntity100001930.
- Conductive_atomic_force_microscopy type ScientificInstrument104147495.
- Conductive_atomic_force_microscopy type Whole100003553.
- Conductive_atomic_force_microscopy comment "Conductive atomic force microscopy (C-AFM) is a variation of atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which uses electrical current to construct the surface profile of the studied sample. The current is flowing through the metal-coated tip of the microscope and the conducting sample. Usual AFM topography, obtained by vibrating the tip, is acquired simultaneously with the current.".
- Conductive_atomic_force_microscopy label "Conductive atomic force microscopy".
- Conductive_atomic_force_microscopy sameAs m.080754n.
- Conductive_atomic_force_microscopy sameAs Q5159384.
- Conductive_atomic_force_microscopy sameAs Q5159384.
- Conductive_atomic_force_microscopy sameAs Conductive_atomic_force_microscopy.
- Conductive_atomic_force_microscopy wasDerivedFrom Conductive_atomic_force_microscopy?oldid=369160285.
- Conductive_atomic_force_microscopy isPrimaryTopicOf Conductive_atomic_force_microscopy.