Matches in DBpedia 2014 for { <http://dbpedia.org/resource/Device_under_test> ?p ?o. }
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- Device_under_test abstract "Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term commonly used to refer to a manufactured product undergoing testing.".
- Device_under_test wikiPageID "5102157".
- Device_under_test wikiPageRevisionID "601392115".
- Device_under_test auto "yes".
- Device_under_test date "December 2009".
- Device_under_test hasPhotoCollection Device_under_test.
- Device_under_test subject Category:Electronic_engineering.
- Device_under_test subject Category:Hardware_testing.
- Device_under_test subject Category:Semiconductor_device_fabrication.
- Device_under_test comment "Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term commonly used to refer to a manufactured product undergoing testing.".
- Device_under_test label "Device Under Test".
- Device_under_test label "Device under test".
- Device_under_test label "被测器件".
- Device_under_test sameAs Device_Under_Test.
- Device_under_test sameAs m.0d2qpn.
- Device_under_test sameAs Q1206780.
- Device_under_test sameAs Q1206780.
- Device_under_test wasDerivedFrom Device_under_test?oldid=601392115.
- Device_under_test isPrimaryTopicOf Device_under_test.