Matches in DBpedia 2014 for { <http://dbpedia.org/resource/Fault_grading> ?p ?o. }
Showing items 1 to 12 of
12
with 100 items per page.
- Fault_grading abstract "Is a procedure that rates testability by relating the number of fabrication defects that can in fact be detected with a test vector set under consideration to the total number of conceivable faults. It is used for refining both the test circuitry and the test patterns iteratively, until a satisfactory fault coverage is obtained.".
- Fault_grading wikiPageID "29152672".
- Fault_grading wikiPageRevisionID "390291949".
- Fault_grading hasPhotoCollection Fault_grading.
- Fault_grading subject Category:Hardware_testing.
- Fault_grading comment "Is a procedure that rates testability by relating the number of fabrication defects that can in fact be detected with a test vector set under consideration to the total number of conceivable faults. It is used for refining both the test circuitry and the test patterns iteratively, until a satisfactory fault coverage is obtained.".
- Fault_grading label "Fault grading".
- Fault_grading sameAs m.0dlldnp.
- Fault_grading sameAs Q5438160.
- Fault_grading sameAs Q5438160.
- Fault_grading wasDerivedFrom Fault_grading?oldid=390291949.
- Fault_grading isPrimaryTopicOf Fault_grading.